DOI: 10.5176/2251-1857_M317.10

Authors: Hansung Kim


Abstract: A lattice model is proposed to simulate the microstructure of thin films. The proposed method can generate a statistically equivalent microstructure to any single phase micrograph with respect to the number of grains and the grain size distribution. A desired grain size distribution is achieved by manipulating nucleation process whose analytical function is obtained by taking into account its domain size and number of grains. Finally, the effects of the grain size distribution on the elastic properties of thin films are investigated. The simulated results show a good agreement with experimental values

Keywords: component; Microstructure, Thin films, Elastic properties

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