DOI: 10.5716/2251-1814_EeL19
Authors: T. Y. Chen, T. C. Huang, S. J. Su, P. Y. Hsieh, J. F. Lin, M. L. Chung
Abstract:
The purpose of this study is to investigate that if concept maps can help students with little prior knowledge to learn white light interferometry for nano-scale surface profile measurement. A course was designed according to the teaching principles of concept maps and a self-developed model of a white-light interferometry system. We hypothesize that these instructional aides can help students understand the core concepts, make connections among them, obtain practical experiences with white-light interferometry and nano-scale measurement. The participants in this study were 27 students, including graduate and undergraduate students. A pre- and post-test was used to assess student knowledge before and after the course, the test scores were analyzed by paired t-test and ANOVA test. The study revealed that the course significantly improved the student achievement, and the students understood four major concepts of properties of light, Michelson interferometer, optical surface profile measurement, and digital image processing. The score of students with little prior knowledge scored lower than the students having more prior knowledge. Nevertheless, students with little prior knowledge made equivalent improvement in scores as those with more prior knowledge. This study indicates that the use of concept map and teaching aid can help students to understand, integrate and improve knowledge of white light interferometry for nano-scale easurement. The concept map teaching style could be usefully applied in other curriculum areas.
Keywords: concept map; teaching aid; learning achievement; white-light interferometry
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